P4C168 查看數據表（PDF） - Semiconductor Corporation

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P4C168

ULTRA HIGH SPEED 4K x 4 STATIC CMOS RAMS

Semiconductor Corporation 

AC TEST CONDITIONS

Input Pulse Levels

Input Rise and Fall Times

Input Timing Reference Level

Output Timing Reference Level

Output Load

GND to 3.0V

3ns

1.5V

1.5V

See Figures 1 and 2

P4C168, P4C169, P4C170

Figure 1. Output Load

* including scope and test fixture.

Note:

Because of the ultra-high speed of the P4C168, P4C169 AND P4C170

care must be taken when testing these devices; an inadequate setup

can cause a normal functioning part to be rejected as faulty. Long high-

inductance leads that cause supply bounce must be avoided by bringing

the VCC and ground planes directly up to the contactor fingers. A high

frequency capacitor of 0.01 µF is also required between VCC and ground.

Figure 2. Thevenin Equivalent

To avoid signal reflections, proper termination must be used; for

example, a 50Ω test environment should be terminated into a 50Ω load

with 1.73V (Thevenin Voltage) at the comparator input, and a 116Ω

resistor must be used in series with DOUT to match 166Ω (Thevenin

Resistance).

LCC PIN CONFIGURATION

Document # SRAM107 REV A

LCC (L9)

Page 7 of 15

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