HEC4007UBDB 查看數據表（PDF） - Philips Electronics
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HEC4007UBDB Datasheet PDF : 8 Pages
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Philips Semiconductors
Dual complementary pair and inverter
Product specification
HEF4007UB
gates
Fig.9 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph Fig.10).
A: average,
B: average + 2 s,
C: average − 2 s, in where ‘s’ is the observed standard deviation.
Fig.10 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.
January 1995
6
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