74ABT273AD 查看數據表（PDF） - Philips Electronics
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74ABT273AD Datasheet PDF : 12 Pages
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Philips Semiconductors
Octal D-type flip-flop
Product specification
74ABT273A
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = +25°C
Tamb = -40°C
to +85°C
Min Typ Max Min Max
VIK
Input clamp voltage
VOH High-level output voltage
VOL
VRST
Low-level output voltage
Power-up output low
voltage3
VCC = 4.5V; IIK = -18mA
VCC = 4.5V; IOH = -3mA; VI = VIL or VIH
VCC = 5.0V; IOH = -3mA; VI = VIL or VIH
VCC = 4.5V; IOH = -32mA; VI = VIL or VIH
VCC = 4.5V; IOL = 64mA; VI = VIL or VIH
VCC = 5.5V; IO = 1mA; VI = GND or VCC
-0.9 -1.2
-1.2
2.5 2.9
2.5
3.0 3.4
3.0
2.0 2.4
2.0
0.42 0.55
0.55
0.13 0.55
0.55
II
Input leakage current
VCC = 5.5V; VI = GND or 5.5V
±0.01 ±1.0
±1.0
IOFF
Power-off leakage current
VCC = 0.0V; VO or VI ≤ 4.5V
±5.0 ±100
±100
ICEX
IO
Output High leakage current
Output current1
VCC = 5.5V; VO = 5.5V; VI = GND or VCC
VCC = 5.5V; VO = 2.5V
5.0 50
50
-50 -70 -180 -50 -180
ICCH
VCC = 5.5V; Outputs High, VI = GND or VCC
150 250
250
Quiescent supply current
ICCL
VCC = 5.5V; Outputs Low, VI = GND or VCC
24
30
30
∆ICC
Additional supply current per VCC = 5.5V; One data input at 3.4V, other
input pin2
inputs at VCC or GND
0.5 1.5
1.5
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
UNIT
V
V
V
V
µA
µA
µA
mA
µA
mA
mA
AC CHARACTERISTICS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500Ω
SYMBOL
PARAMETER
WAVEFORM
fMAX
Maximum clock frequency
1
tPLH
Propagation delay
tPHL
CP to Qn
1
tPHL
Propagation delay
MR to Qn
2
LIMITS
Tamb = +25°C
VCC = +5.0V
Min
Typ
Max
Tamb = -40°C to +85°C
VCC = +5.0V ±0.5V
Min
Max
250
350
250
1.5
3.0
4.0
1.5
4.8
2.0
3.4
4.6
2.0
4.8
2.5
4.5
6.0
2.5
6.6
UNIT
MHz
ns
ns
1995 Sep 06
5
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