N74F543DB 查看數據表（PDF） - Philips Electronics

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N74F543DB

Octal registered transceiver, non-inverting (3-State)

Philips Electronics 

Philips Semiconductors

Octal registered transceiver, non-inverting (3-State)

Product data sheet

74F543

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

VOH HIGH-level output voltage

VOL LOW-level output voltage

VIK

Input clamp voltage

II

Input current at maximum

input voltage

IIH

HIGH-level input current

IIL

LOW-level input current

A0 - A7

B0 - B7

± 10 % VCC 2.4

–

–

V

VCC = MIN

VIL = MAX

IOH = –3 mA

± 5 % VCC

2.7

3.4

–

V

VIH = MIN

± 10 % VCC

IOH = –15 mA ± 5 % VCC

2.0

2.0

–

–

–

–

V

V

A0 - A7

B0 - B7

± 10 % VCC – 0.35 0.50 V

VCC = MIN

VIL = MAX

IOL = 24 mA

± 5 % VCC

–

0.35 0.50 V

VIH = MIN

IOL = 64 mA

± 10 % VCC

± 5 % VCC

–

–

– 0.55

0.42 0.55

V

V

VCC = MIN; II = IIK

– –0.73 –1.2 V

OEAB, OEBA, EAB VCC = MAX; VI = 7.0 V

–

– 100 µA

Others

VCC = 5.5 V; VI = 5.5 V

–

–

1 mA

VCC = MAX; VI = 2.7 V

–

–

20 µA

Others

EAB, EBA

VCC = MAX; VI = 0.5 V

–

– –0.6 mA

–

– –1.2 mA

IOZH + IIH

IOZH + IIL

IOS

Off-state output current, HIGH-level voltage applied

Off-state output current, LOW-level voltage applied

Short-circuit output current3

A0 - A7

B0 - B7

VCC= MAX; VO = 2.7 V

VCC= MAX; VO = 0. 5 V

VCC = MAX

–

–

70 µA

–

– –600 µA

–60 – –150 mA

–100 – –225 mA

ICCH

–

70 105 mA

ICC

Supply current (total)

ICCL

VCC = MAX

–

95 135 mA

ICCZ

–

95 135 mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under the recommended operating conditions for the applicable

type.

2. All typical values are at VCC = 5 V, Tamb = 25 °C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

2004 Jul 22

6

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