HS-65647RH 查看數據表（PDF） - Intersil

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HS-65647RH

Radiation Hardened 8K x 8 SOS CMOS Static RAM

Intersil 

HS-65647RH

TABLE 5. BURN-IN DELTA PARAMETERS (+25oC), GROUP B, SUBGROUP 5

PARAMETER

SYMBOL

DELTA LIMITS

Standby Supply Current

IDDSB

±150µA

High Impedance Output Leakage Current

IOZH, IOZL

± 2µA

Input Leakage Current

IIH, IIL

± 150nA

Low Level Output Voltage

VOL

± 60mV

Output High Voltage

VOH

± 150mV

TABLE 6. APPLICABLE SUBGROUPS

GROUP A SUBGROUPS

CONFORMANCE

GROUP

MIL-STD-883

METHOD

TESTED FOR -Q

RECORDED

FOR -Q

TESTED FOR -8

RECORDED

FOR -8

Initial Test

100% 5004

1, 7, 9

1 (Note 2)

1, 7, 9

Interim Test

100% 5004

1, 7, 9, ∆

1, ∆ (Note 2)

1, 7, 9

PDA

100% 5004

1, 7, ∆

-

1, 7

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

-

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

-

1, 2, 3, 7, 8A, 8B, 9,

10, 11

Subgroup B5

Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, ∆ 1, 2, 3, ∆ (Note 2)

N/A

Subgroup B6

Sample 5005

1, 7, 9

-

N/A

Group C

Sample 5005

N/A

N/A

1, 2, 3, 7, 8A, 8B, 9,

10, 11

Group D

Sample 5005

1, 7, 9

-

1, 7, 9

Group E, Subgroup 2

Sample 5005

1, 7, 9

-

1, 7, 9

NOTES:

1. Alternate Group A testing in accordance with MIL-STD-883 method 5005 may be exercised.

2. Table 5 parameters only

Spec Number 518729

829

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