HS-82C55ARH(1995) 查看數據表（PDF） - Intersil

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HS-82C55ARH
(Rev.:1995)

Radiation Hardened CMOS Programmable Peripheral Interface

Intersil 

Specifications HS-82C55ARH

TABLE 5. BURN-IN DELTA PARAMETERS (+25oC)

PARAMETER

SYMBOL

DELTA LIMITS

Static Current

IDDSB

±10µA

Input Leakage Current

IIL, IIH

±200nA

Output Leakage Current

IOZL, IOZH

±2µA

Low Level Output Voltage

VOL

±80mV

TTL Output High Voltage

VOH1

±600mV

CMOS Output High Voltage

VOH2

±150mV

TABLE 6. APPLICABLE SUBGROUPS

GROUP A SUBGROUPS

CONFORMANCE

GROUP

MIL-STD-883

METHOD

TESTED FOR -Q

RECORDED

FOR -Q

TESTED FOR -8

RECORDED

FOR -8

Initial Test

100% 5004

1, 7, 9

1 (Note 2)

1, 7, 9

Interim Test

100% 5004

1, 7, 9, ∆

1, ∆ (Note 2)

1, 7, 9

PDA

100% 5004

1, 7, ∆

-

1, 7

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

-

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

-

1, 2, 3, 7, 8A, 8B, 9,

10, 11

Subgroup B5

Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, ∆ 1, 2, 3, ∆ (Note 2)

N/A

Subgroup B6

Sample 5005

1, 7, 9

-

N/A

Group C

Sample 5005

N/A

N/A

1, 2, 3, 7, 8A, 8B, 9,

10, 11

Group D

Sample 5005

1, 7, 9

-

1, 7, 9

Group E, Subgroup 2

Sample 5005

1, 7, 9

-

1, 7, 9

NOTES:

1. Alternate Group A testing in accordance with MIL-STD-883 method 5005 may be exercised.

2. Table 5 parameters only

Spec Number 518060

975

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