TB2904HQ 查看數據表（PDF） - Toshiba

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TB2904HQ

TOSHIBA Bi-CMOS Digital Integrated Circuit Silicon Monolithic

Toshiba 

Offset detection

Detection threshold voltage

Test Circuit

TB2904HQ(o)

Voff-set



Rpull-up = 47 kΩ, +V = 5.0V

Based on output DC voltage

±1.0 ±1.5 ±2.0

V

1

20

6

TAB VCC1 VCC2

0.22 µF

IN1

11

C1

OUT1 (+)

9

PW-GND1 8

RL

OUT1 (−)

7

0.22 µF

IN2

12

C1

1 µF

C6

16 AC-GND

0.223 µF

IN3

15

C1

OUT2 (+)

5

PW-GND2 2

RL

OUT2 (−)

3

OUT3 (+)

17

PW-GND3 18

RL

OUT3 (−)

19

0.22 µF

14

C1

PRE-GND

13

IN4

RIP

10

OUT4 (+)

21

PW-GND4 24

OUT4 (−)

23

STBY

4

OFF-SET

DET MUTE

25

22

47 kΩ

R1

RL

5V

PLAY

MUTE

: PRE-GND

: PW-GND

Components in the test circuits are only used to obtain and confirm the device characteristics.

These components and circuits do not warrant to prevent the application equipment from malfunction or failure.

9

2004-03-26

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