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TLE5250 查看數據表(PDF) - Infineon Technologies

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TLE5250 Datasheet PDF : 22 Pages
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TLE 5250
Diagnostics
The information from the different parts of the circuit is collected in the diagnostics and
stored in the fault logic. The information is read out on the Diagnostics output (open
collector).
The fault logic consists of a 16-bit multiplexer that switches information in three
categories through to the Diagnostics output.
Bit 0 always appears inverted on DIAG when EN is High. This means that, if there is
overcurrent on the upper transistor, undervoltage or overtemperature, it will be signaled
immediately on the Diagnostics output. DIAG changes from High to Low.
Bit 1: check bit.
Bits 2, 3, 4 and 5 indicate the momentary status of the comparators on the two outputs
(see Figure 2). Changes in the status of the comparators for output monitoring can be
observed on DIAG when EN is Low and the counter of the multiplexer is on 2, 3, 4 or 5.
This is necessary for detecting underload.
Bits 6, 7, 8, 9
The monoflop generates a short strobe signal when the EN edge changes from High to
Low. The status of the comparators for output monitoring is stored with this signal and
can be read out in bits 6, 7, 8 and 9.
When Enable is Low, the Phase input is used as a clock input. As the edge rises, an
internal counter is incremented and the corresponding channel of the multiplexer is
switched through. As the edge falls, the signal is output inverted. When Enable is High,
the counter is reset to zero.
EN
Strobe
Reset
Figure 3
AED01467
Semiconductor Group
7
1998-02-01

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