N74F1779N 查看數據表（PDF） - Philips Electronics
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N74F1779N Datasheet PDF : 12 Pages
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Philips Semiconductors
8-bit bidirectional binary counter (3-State)
Product specification
74F1779
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VCC = MIN,
±10%VCC
2.5
V
TC
VIL = MAX IOH = –1mA
VIH = MIN
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
VCC = MIN,
±10%VCC
2.4
V
I/On
VIL = MAX IOH = –3mA
VIH = MIN
±5%VCC
2.7
3.3
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX
VIH = MIN
IOL = MAX
±10%VCC
±5%VCC
0.30 0.50
V
0.35 0.50
V
VIK
II
IIH
IIL
IIH+IOZH
IIL+IOZL
Input clamp voltage
Input current at maximum
input voltage
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
I/On
others
except
I/On
I/On
VCC = MIN, II = IIK
VCC = 5.5V, VI = 5.5V
VCC = 5.5V, VI = 7.0V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
VCC = MAX, VO = 0.5V
–0.73 –1.2
V
1
mA
100
µA
20
µA
–0.6
mA
70
µA
–600
µA
IOS
Short-circuit output current3
VCC = MAX
ICCH
–60
–150
mA
100
145
mA
ICC
Supply current (total)
ICCL
VCC = MAX
100
145
mA
ICCZ
110
155
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V. Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other tests. In any sequence of
parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
fMAX
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
Maximum clock frequency
Propagation delay
CP to I/On
Propagation delay
CP to TC
Propagation delay
CET to TC
Output Enable time to
High or Low level
Output Enable time from
High or Low level
TEST
CONDITION
Waveform 1
Waveform 1
Waveform 1
Waveform 2
Waveform 4
Waveform 5
Waveform 4
Waveform 5
LIMITS
Tamb = +25°C
VCC = +5.0V
CL = 50pF, RL = 500Ω
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF, RL = 500Ω
MIN TYP MAX
MIN
MAX
115 130
100
4.0
6.5 10.0
4.0
10.5
5.0
7.0 10.5
5.0
11.0
4.0
6.5
9.0
3.5
9.5
4.5
6.5
9.0
4.0
9.5
2.0
4.0
6.5
2.0
7.5
2.5
4.5
7.0
2.5
7.5
2.0
4.0
6.5
2.0
7.5
4.5
6.5
9.0
4.0
9.5
1.0
3.0
6.0
1.0
6.5
1.0
4.0
7.0
1.0
7.5
UNIT
MHz
ns
ns
ns
ns
ns
1989 Apr 06
6
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