74F161A 查看數據表（PDF） - Philips Electronics
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74F161A Datasheet PDF : 14 Pages
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Philips Semiconductors
4-bit binary counters
Product specification
74F161A, 74F163A
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
Commercial range
Industrial range
LIMITS
MIN
NOM
MAX
4.5
5.0
5.5
2.0
0.8
–18
–1
20
0
+70
–40
+85
UNIT
V
V
V
mA
mA
mA
°C
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH
High-level output voltage
VOL
Low-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN
IOH = MAX
±10%VCC
±5%VCC
2.5
2.7
3.4
V
V
VCC = MIN, VIL = MAX,
VIH = MIN
IOL = MAX
±10%VCC
±5%VCC
0.30 0.50 V
0.30 0.50 V
VIK
Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input voltage VCC = MAX, VI = 7.0V
IIH
High-level input current
VCC = MAX, VI = 2.7V
CET, PE
IIL
Low-level input current
others
VCC = MAX, VI = 0.5V
–0.73 –1.2 V
100 µA
20
µA
–1.2 mA
–0.6 mA
IOS
Short-circuit output current3
VCC = MAX
-60
–150 mA
ICC
Supply current (total)
ICCH
ICCL
VCC = MAX
42
55
mA
49
65
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1996 Jan 29
7
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