74F862 查看數據表（PDF） - Philips Electronics

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产品描述 (功能)

比赛名单

74F862

Bus transceivers (3-State)

Philips Electronics 

Philips Semiconductors

Bus transceivers (3-State)

Product specification

74F862, 74F863

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

VOH

High-level output voltage

VCC = MIN,

±10%VCC 2.4

V

VIL = MAX, IOH = –1 mA

VIH = MIN

±5%VCC

2.4

3.3

V

VCC = MIN,

±10%VCC 2.0

V

VIL = MAX, IOH = –24 mA

VIH = MIN

±5%VCC

2.0

V

VOL

Low-level output voltage

VCC = MIN, IOL = –48 mA

VIL = MAX,

VIH = MIN IOL = 64 mA

±10%VCC

±5%VCC

0.38 0.55

V

0.42 0.55

V

VIK

II

IIH

IIL

IIH + IOZH

IIL + IOZL

IOS

ICC

Input clamp voltage

Input current at

maximum input voltage

High-level input current

OEAB, OEBA

OEABn, OEBAn

An, Bn

Low-level input current

Off-state output current

High-level voltage applied

Off-state output current

Low-level voltage applied

Short-circuit output current3

An, Bn

An, Bn

Supply current total

ICCH

74F863 ICCL

ICCZ

ICCH

74F862 ICCL

ICCZ

VCC = MIN, II = IIK

VCC = 0.0 V, VI = 7.0 V

VCC = 5.5 V, VI = 5.5 V

VCC = MAX, VI = 2.7 V

VCC = MAX, VI = 0.5 V

VCC = MAX, VO = 2.7 V

VCC = MAX, VO = 0.5 V

VCC = MAX

VCC = MAX

VCC = MAX

–0.73 –1.2

V

100

µA

1

mA

20

µA

–20

µA

70

µA

–70

µA

–100

–225

mA

145

195

mA

140

195

mA

165

220

mA

90

130

mA

120

170

mA

130

160

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5 V, Ta = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

2000 Mar 24

6

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