M74VHC594M1R 查看數據表（PDF） - STMicroelectronics

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M74VHC594M1R

8 BIT SHIFT REGISTER WITH OUTPUT REGISTER

STMicroelectronics 

74VHC594

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance

7

pF

COUT Output

Capacitance

9

pF

CPD Power Dissipation

Capacitance

70

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC

DYNAMIC SWITCHING CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

VOLP Dynamic Low

0.9 1.2

Voltage Quiet

5.0

V

VOLV Output (note 1, 2)

-0.9 -1.2

Dynamic High

VIHD Voltage Input

5.0

CL = 50 pF

3.5

V

(note 1, 3)

Dynamic Low

VILD Voltage Input

5.0

(note 1, 3)

1.5

V

1) Worst case package.

2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.

3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (VILD), 0V to threshold

(VIHD), f=1MHz.

TEST CIRCUIT

CL = 15/50pF or equivalent (includes jig and probe capacitance)

RT = ZOUT of pulse generator (typically 50Ω)

7/11

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