ADF4196 查看數據表（PDF） - Analog Devices

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ADF4196

Low Phase Noise, Fast Settling, 6 GHz PLL Frequency Synthesizer

Analog Devices 

Data Sheet

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.

Table 3.

Parameter

AVDD to Ground

AVDD to DVDD1, DVDD2, DVDD3, SDVDD

VP1, VP2, VP3 to Ground

VP1, VP2, VP3 to AVDD

Digital I/O Voltage to Ground

Analog I/O Voltage to Ground

REFIN, RFIN+, RFIN− to Ground

Operating Temperature Range

Industrial

Storage Temperature Range

Maximum Junction Temperature

Reflow Soldering

Peak Temperature

Time at Peak Temperature

Rating

−0.3 V to +3.6 V

−0.3 V to +0.3 V

−0.3 V to +5.8 V

−0.3 V to +5.8 V

−0.3 V to VDD + 0.3 V

−0.3 V to VP1, VP2, VP3 + 0.3 V

−0.3 V to VDD + 0.3 V

−40°C to +85°C

−65°C to +125°C

150°C

260°C

40 sec

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

This device is a high performance RF integrated circuit with

an ESD rating of <2 kV, and it is ESD sensitive. Take proper

precautions for handling and assembly.

ADF4196

THERMAL RESISTANCE

θJA is specified for the worst-case conditions, that is, a device

soldered in a circuit board for surface-mount packages.

Table 4. Thermal Resistance

Package Type

θJA

32-Lead LFCSP (Paddle Soldered) 27.3

Unit

°C/W

TRANSISTOR COUNT

This device includes 75,800 metal oxide semiconductors (MOS)

and 545 bipolar junction transistors (BJT).

ESD CAUTION

Rev. B | Page 5 of 28

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