ADG431 查看數據表（PDF） - Analog Devices

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比赛名单

ADG431

LC2MOS Precision Quad SPST Switches

Analog Devices 

Test Circuits

IDS

V1

S

D

VS

RON = V1/IDS

Test Circuit 1. On Resistance

ADG431/ADG432/ADG433

IS (OFF)

S

A

VS

ID (OFF)

D

A

VD

Test Circuit 2. Off Leakage

ID (ON)

S

D

A

VS

VD

Test Circuit 3. On Leakage

+15V +5V

0.1␮F

0.1␮F

VDD

VL

3V

VIN ADG431

50%

50%

S

D

VOUT

3V

VS

IN

RL

300⍀

CL

35pF

VIN ADG432 50%

50%

GND

VSS

VOUT

90%

90%

0.1␮F

–15V

tON

tOFF

Test Circuit 4. Switching Times

+15V +5V

0.1␮F

0.1␮F

VDD

VS1

S1

S2

VS2

IN1, IN2

VIN

GND

VL

D1

D2

RL2

300⍀

VSS

VOUT2

CL2

35pF

RL1

300⍀

VOUT1

CL1

35pF

0.1␮F

–15V

3V

VIN

0V

VOUT1

0V

50%

90%

VOUT2

90%

0V

tD

Test Circuit 5. Break-Before-Make Time Delay

50%

90%

90%

tD

RS

VS

+15V +5V

VDD

S

IN

GND

VL

3V

D

VOUT

VIN

CL

10nF

VSS

–15V

VOUT

QINJ = CL ؋ ⌬VOUT

Test Circuit 6. Charge Injection

⌬VOUT

REV. C

–7–

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