ADG506A/ADG507A–Test Circuits
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. tR = tF = 20 ns.
Test Circuit 1. RON
Test Circuit 2. IS (OFF)
Test Circuit 3. ID (OFF)
Test Circuit 4. ID (ON)
Test Circuit 5. IDIFF
Test Circuit 6. Switching Time of Multiplexer, tTRANSITION
Test Circuit 7. Break-Before-Make Delay, tOPEN
–6–
REV. C