HD74LS75P 查看數據表（PDF） - Renesas Electronics
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HD74LS75P Datasheet PDF : 6 Pages
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HD74LS75
Testing Method
Test Circuit
VCC
DG
QQ
P.G.
Zout = 50Ω
P.G.
Zout = 50Ω
DQ
Q
G
RL
RL
CL
CL
Notes:
1. Test is put into the each flip-flop.
2. CL includes probe and jig capacitance.
3. All diodes are 1S2074(H).
Waveform
Notes:
tTLH
1µs
tTHL
1µs
90%
90%
3V
D
1.3 V
1.3 V
1.3 V
10%
10%
tsu
tTLH
th
tTHL
tsu
th
0V
90% 90%
3V
G
1.3 V 1.3 V
1.3 V 1.3 V
10% 10%
0V
500ns
tPLH
tPLH
500ns
tPHL
tPHL
Q
VOH
1.3 V
1.3 V
tPLH
VOL
Q
1.3 V
tPHL
tPHL
tPLH
1.3 V
VOH
VOL
1. Input pulse; D input: PRR = 500 kHz, G input; PRR = 1 MHz, tTHL ≤ 10 ns,tTLH ≤ 10 ns.
2. When measuring propugation delay times from the D input, the corresponding G input must be
held high.
Rev.3.00, May 10, 2006, page 4 of 5
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