HI-516 查看數據表（PDF） - Intersil
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HI-516 Datasheet PDF : 8 Pages
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HI-516
Test Circuits and Waveforms VDD/LLS = GND, Unless Otherwise Specified.
IOUT 100µA
IN
±10V
VIN
V2
OUT
V2
rON = 100µA
±10V
EN
0.8V
OUT
A ID(OFF)
10V
FIGURE 1. ON RESISTANCE TEST CIRCUIT
FIGURE 2. ID(OFF) TEST CIRCUIT (NOTE 8)
IS(OFF) A
±10V
OUT
EN
10V
0.8V
OUT
EN
A ID(ON)
10V
±10V
2.4V
FIGURE 3. IS(OFF) TEST CIRCUIT (NOTE 8)
FIGURE 4. ID(ON) TEST CIRCUIT (NOTE 8)
50%
+10V
tA
3.5V ADDRESS
DRIVE (VA)
0V
10%
OUTPUT
-10V
+15V
VA
50Ω
2.4V
A3/SDS
V+
IN 1
A2
IN 2-15
A1
IN 16
A0
OUT A
EN
OUT B
VDD/LLS V-
GND
-15V
±10V
10V
10 50
kΩ pF
FIGURE 5A. MEASUREMENT POINTS
FIGURE 5B. TEST CIRCUIT
NOTE:
8. Two measurements per channel: ±10V and 10V. (Two measurements per device for ID(OFF) ±10V and 10V).
FIGURE 6. ACCESS TIME
6
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