IRHN7250(2014) 查看數據表（PDF） - International Rectifier
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IRHN7250 Datasheet PDF : 12 Pages
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RPraed-iIarrtiaodniaCtihoanracteristics
IRHN7250, JANSR2N7269U
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ÄÅ
Parameter
100 KRads(Si)1 300K - 1000K Rads (Si)2 Units
Min Max Min Max
Test Conditions
BVDSS Drain-to-Source Breakdown Voltage 200
—
200 —
V
V G S ( t h ) Gate Threshold Voltage
2.0 4.0 1.25 4.5
IGSS
IGSS
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
— 100
— -100
— 100 nA
— -100
IDSS
Zero Gate Voltage Drain Current
—
25
—
50 µA
RDS(on) Static Drain-to-Source Ã
— 0.100 — 0.155 Ω
On-State Resistance (TO-3)
RDS(on) Static Drain-to-Source Ã
— 0.100 — 0.155 Ω
On-State Resistance (SMD-1)
VGS = 0V, ID = 1.0mA
VGS = VDS, ID = 1.0mA
VGS = 20V
VGS = -20 V
VDS =160V, VGS = 0V
VGS = 12V, ID =16A
VGS = 12V, ID =16A
VSD
Diode Forward Voltage Ã
— 1.4 —
1.4 V
VGS = 0V, IS = 26A
1. Part number IRHN7250 (JANSR2N7269U)
2. Part numbers IRHN3250 (JANSF2N7269U), IRHN4250 (JANSG2N7269U) and IRHN8250 (JANSH2N7269U)
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Typical Single Event Effect Safe Operating Area
Ion
LET
Energy
(MeV/(mg/cm2)) (MeV)
Cu
28
285
Br
36.8
305
Range
(µm) @VGS=0V @VGS=-5V
43
190
180
39
100
100
VDS (V)
@VGS=-10V
170
100
@VGS=-15V @VGS=-20V
125
—
50
—
200
150
Cu
100
Br
50
0
0
-5
-10
-15
-20
VGS
Fig a. Typical Single Event Effect, Safe Operating Area
For footnotes refer to the last page
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