MC33178 查看數據表（PDF） - ON Semiconductor
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MC33178 Datasheet PDF : 19 Pages
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MC33178, MC33179
20
Input Noise Voltage Test
18
Circuit
+
16
−
VO
14
12
10
8.0
6.0
4.0
VCC = +15 V
2.0
VEE = −15 V
TA = 25°C
0
10
100
1.0 k
10 k
10 k
f, FREQUENCY (Hz)
Figure 28. Input Referred Noise Voltage
versus Frequency
0.5
Input Noise Current Test Circuit
0.4
+
RS
−
VO
0.3
0.2
(RS = 10 kW)
0.1
VCC = +15 V
VEE = −15 V
TA = 25°C
0
10
100
1.0 k
10 k
f, FREQUENCY (Hz)
100 k
Figure 29. Input Referred Noise Current
versus Frequency
100
90 VCC = +15 V
80 VEE = −15 V
70 TA = 25°C
60
50
RL = 600 W
40
RL = 2.0 kW
30
20
10
0
10
100
1.0 k
10 k
CL, LOAD CAPACITANCE (pF)
Figure 30. Percent Overshoot versus
Load Capacitance
VCC = +15 V
VEE = −15 V
AV = +1.0
RL = 600 W
CL = 100 pF
TA = 25°C
t, TIME (2.0 ms/DIV)
Figure 31. Non−inverting Amplifier Slew Rate
VCC = +15 V
VEE = −15 V
AV = +1.0
RL = 600 W
CL = 100 pF
TA = 25°C
VCC = +15 V
VEE = −15 V
AV = +1.0
RL = 600 W
CL = 100 pF
TA = 25°C
t, TIME (2.0 ns/DIV)
Figure 32. Small Signal Transient Response
t, TIME (5.0 ms/DIV)
Figure 33. Large Signal Transient Response
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