MC74HC374ADT 查看數據表（PDF） - ON Semiconductor

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MC74HC374ADT

Octal 3−State Non−Inverting D Flip−Flop

ON Semiconductor 

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

MC74HC374A

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kW

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 4.

*Includes all probe and jig capacitance

Figure 5.

D0

3

DQ

D1

4

DQ

D2

7

DQ

D3

8

DQ

D4

13

DQ

D5

14

DQ

D6

17

DQ

D7

18

DQ

Clock 11

Output 1

Enable

C

C

C

C

C

C

C

C

2

5

6

9

12

15

16

19

Q0

Q1

Q2

Q3

Q4

Q5

Q6

Q7

Figure 6. Expanded Logic Diagram

http://onsemi.com

6

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