MCP6286 查看數據表（PDF） - Microchip Technology

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MCP6286

Low Noise, Low Power Op Amp

Microchip Technology 

1.2 Test Circuits

The circuit used for most DC and AC tests is shown in

Figure 1-1. It independently sets VCM and VOUT; see

Equation 1-1. The circuit’s common mode voltage is

(VP + VM)/2, not VCM. VOST includes VOS plus the

effects of temperature, CMRR, PSRR and AOL.

EQUATION 1-1:

GDM = RF ⁄ RG

GN = 1 + GDM

VCM = VP(1 – 1 ⁄ GN) + VREF(1 ⁄ GN)

VOST = VIN– – VIN+

VOUT = VREF + (VP – VM)GDM + VOSTGN

Where:

GDM = Differential Mode Gain

GN = Noise Gain

VCM = Op Amp’s Common Mode

Input Voltage

VOST = Op Amp’s Total Input Offset

Voltage

(V/V)

(V/V)

(V)

(mV)

MCP6286

CF

6.8 pF

RG

100 kΩ

VP

VIN+

RF

100 kΩ

MCP6286

VIN–

VM

RG

100 kΩ

RF

100 kΩ

VREF = VDD/2

VDD

CB1

100 nF

CB2

1 µF

RL

10 kΩ

VOUT

CL

60 pF

CF

6.8 pF

VL

FIGURE 1-1:

AC and DC Test Circuit for

Most Specifications.

© 2009 Microchip Technology Inc.

DS22196A-page 5

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