74F299 查看數據表（PDF） - Philips Electronics
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74F299 Datasheet PDF : 14 Pages
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Philips Semiconductors
8-bit universal shift/storage register (3-State)
Product specification
74F299
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
LIMITS
TYP
MIN NO TAG MAX
UNIT
VOH
Q0, Q7
High-level output voltage
VCC = MIN,
VIL = MAX,
IOH = –1mA
±10%VCC
±5%VCC
2.5
2.7
3.4
V
V
I/On
VIH = MIN
IOH = –3mA ±10%VCC
2.4
V
±5%VCC
2.7
3.3
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
IOL = MAX
±10%VCC
±5%VCC
0.35 0.50
V
0.35 0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at
others
maximum input voltage
I/On
VCC = MAX, VI = 7.0V
VCC = 5.5V, VI = 5.5V
100
µA
1
mA
except
IIH
High-level input current I/On
VCC = MAX, VI = 2.7V
20
µA
S0, S1
IIL
Low-level input current
others
VCC = MAX, VI = 0.5V
–1.2
mA
–0.6
mA
Off-state output current,
IIH + IOZH High-level voltage
applied
I/On
only
IIL + IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO = 2.7V
VCC = MAX, VO = 0.5V
70
µA
–0.6
mA
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60
–150
mA
ICCH
55
60
mA
ICC
Supply current (total)
ICCL
VCC = MAX
70
90
mA
ICCZ
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1990 Mar 01
6
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