N74F533D 查看數據表（PDF） - Philips Electronics
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N74F533D Datasheet PDF : 12 Pages
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Philips Semiconductors
Latch/flip-flop
Product specification
74F533,* 74F534
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage
VOL
Low-level output voltage
VIK
Input clamp voltage
II
Input current at
maximum input voltage
VCC = MIN, VIL = MAX,
±10%VCC
2.4
V
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.3
V
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
±10%VCC
±5%VCC
0.35 0.50
V
0.35 0.50
V
VCC = MIN, II = IIK
–0.73 –1.2
V
VCC = MAX, VI = 7.0V
100
µA
IIH
IIL
IOZH
High-level input current
Low-level input current
Off-state output current,
High-level voltage applied
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
20
µA
–0.6
mA
50
µA
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
74F533
OE=4.5V, Dn=E=GND
ICC
Supply current (total)
VCC = MAX
74F534
OE=4.5V, Dn=GND
41
61
mA
51
86
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
fMAX
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
Propagation delay
Dn to Qn
Propagation delay
E to Qn
Output Enable time
to High or Low level
Output Disable time
from High or Low level
Maximum Clock frequency
Propagation delay
CP to Qn
Output Enable time
to High or Low level
Output Disable time
from High or Low level
74F533
74F534
TEST
CONDITIONS
Waveform 2
Waveform 3
Waveform 6
Waveform 7
Waveform 6
Waveform 7
Waveform 1
Waveform 1
Waveform 6
Waveform 7
Waveform 6
Waveform 7
LIMITS
Tamb= +25°C
VCC = +5V
CL = 50pF, RL = 500Ω
MIN
TYP MAX
Tamb = 0°C to +70°C
VCC = +5V ± 10%
CL = 50pF, RL = 500Ω
MIN
MAX
4.0
6.0
8.5
4.0
9.5
3.0
4.5
7.0
3.0
8.0
5.0
6.5
9.5
5.0
10.0
3.0
4.5
7.0
3.0
8.0
2.0
4.5
7.0
2.0
8.0
2.0
5.0
7.0
2.0
8.0
2.0
3.5
6.0
2.0
7.0
2.0
3.0
5.5
2.0
6.5
150
165
135
3.0
4.5
7.0
2.5
7.5
3.0
4.5
7.0
2.5
7.5
2.0
4.5
7.5
2.0
8.5
2.0
5.0
7.5
2.0
8.5
2.0
3.5
6.5
2.0
7.5
2.0
3.5
5.5
2.0
6.5
UNIT
ns
ns
ns
ns
MHz
ns
ns
ns
* Discontinued part. Please see the Discontinued Products List.
1999 Jan 08
6
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