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FB2033BB

8-bit latched/registered/pass-thru Futurebus+ universal interface transceiver

Philips Electronics 

Philips Semiconductors

8-bit latched/registered/pass-thru

Futurebus+ universal interface transceiver

Product specification

FB2033

DC ELECTRICAL CHARACTERISTICS

Over recommended operating free-air temperature range unless otherwise noted.

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

IOH High level output current B0 – Bn

VCC = MAX, VIL = MAX, VIH = MIN, VOH = 1.9V

100

µA

IOFF Power-off output current B0 – Bn

VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 1.9V

100

µA

VOH

High-level output voltage AO0 – AOn 4 VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA

2.5 2.85

V

AO0 – AOn 4 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA

0.5

VOL

Low-level output voltage

B0 – Bn

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA .75

1.0

1.15

V

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 4mA

0.5

VIK

Input clamp voltage

Except

B0–Bn

B0 – Bn

VCC = MIN, II = IIK

VCC = MIN, II = IIK 6

VCC = MIN, II = -18mA

-0.5

0.3

V

-1.2

II

Input current at maximum Except

input voltage

B0–Bn

VCC = MAX, VI = 0.0V or 5.5V

±50

µA

IIH

High-level input current

IIL

Low-level input current

IOZH

IOZL

IOS

Off-state output current

Off-state output current

Short-circuit output

current 3

Except

B0–Bn

B0 – Bn

Except

B0–Bn

B0 – Bn

AO0 – AOn

AO0 – AOn

AO0 – AOn

only

VCC = MAX, VI = 2.7V, Bn = AIn = 0V

VCC = MAX, VI = 1.9V

VCC = MAX, VI = 3.5V 5

VCC = MAX, VI = 0.5V

VCC = MAX, VI = 0.75V

VCC = MAX, VO = 2.7V

VCC = MAX, VO = 0.5V

VCC = MAX, VO = 0.0V

20

µA

100

100

mA

-20

µA

-100

50

µA

-50

µA

-45

-150 mA

ICC

Supply current (total)

AIn to Bn

Bn to AOn

Bn to AOn

VCC = MAX, outputs Low or High

VCC = MAX, outputs Low

VCC = MAX, outputs High

24

50

45

75

mA

22

44

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

4. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side.

5. For B port input voltage between 3 and 5 volts IIH will be greater than 100µA, but the parts will continue to function normally.

6. B0 – B7 clamps remain active for a minimum of 80ns following a High-to-Low transition.

1995 May 25

6

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