RT8055B 查看數據表（PDF） - Richtek Technology
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产品描述 (功能)
比赛名单
RT8055B Datasheet PDF : 13 Pages
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RT8055B
Parameter
Peak Current Limit
Under Voltage Lockout
Threshold
Shutdown Threshold
Power Good (PGOOD)
Power Good Threshold
Symbol
Test Conditions
IL IM
VDD Rising
VDD Falling
VSHDN VSHDN Rising
VOUT Falling (Fault)
VOUT Rising (Good)
VOUT Rising (Fault)
VOUT Falling (Good)
Min
Typ
Max Unit
3.5
--
--
A
--
2.4
--
V
--
2.2
--
V
-- VIN − 0.85 VIN − 0.4 V
--
87
--
90
--
114
--
111
--
%V OU T
--
%V OU T
--
%V OU T
--
%V OU T
Note 1. Stresses listed as the above “Absolute Maximum Ratings” may cause permanent damage to the device. These are for
stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may remain possibility to affect device reliability.
Note 2. θJA is measured in the natural convection at TA = 25°C on a high effective thermal conductivity four layers test board of
JEDEC 51-7 thermal measurement standard. The case point of θJC is on the exposed pad for the package.
Note 3. Devices are ESD sensitive. Handling precaution is recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
DS8055B-03 April 2011
www.richtek.com
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