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SAF-XC822-1FRI(2010) 查看數據表(PDF) - Infineon Technologies

零件编号
产品描述 (功能)
比赛名单
SAF-XC822-1FRI
(Rev.:2010)
Infineon
Infineon Technologies Infineon
SAF-XC822-1FRI Datasheet PDF : 52 Pages
First Prev 51 52
XC822/824
Package and Quality Declaration
4.3
Quality Declaration
Table 25 shows the characteristics of the quality parameters in the XC822/824.
Table 25 Quality Parameters
Parameter
Symbol Limit Values
Min. Max.
Operation Lifetime when tOP1
-
the device is used at the
-
three stated TJ1)
-
1500
15000
1500
Operation Lifetime when tOP2
-
the device is used at the
stated TJ1)
ESD susceptibility
VHBM
-
according to Human Body
Model (HBM)
131400
2000
ESD susceptibility
VCDM
-
500
according to Charged
Device Model (CDM) pins
1) This lifetime refers only to the time when device is powered-on.
Unit
hours
hours
hours
hours
V
V
Notes
TJ = 150°C
TJ = 110°C
TJ = -40°C
TJ = 27°C
Conforming to
EIA/JESD22-
A114-B
Conforming to
JESD22-C101-C
Data Sheet
45
V1.1, 2010-10

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