TD62784AP 查看數據表（PDF） - Toshiba

零件编号

产品描述 (功能)

比赛名单

TD62784AP

8ch High-Voltage Source Driver

Toshiba 

Test Circuit

1. ICEX

VCC

VIN

TD62783,784AP/AF

ICEX

2. VCE (sat)

VCC

VCE (sat)

VIN

IOUT

3. IIN (ON), ICC

VCC

IIN (ON)

VIN

4. VIN (ON), VIN (OFF)

VCC

VCE

VIN (ON), VIN (OFF)

5. IR

IOUT

VCC

IR VR

6. VF

Open

VF

IF

7. tON, tOFF

Input VCC

Pulse

generator

(Note 1)

VIN

Input

RL CL

(Note 2)

Output

50%

50%

50 µs

tON

tOFF

50%

50%

VIH

0

VOH

VOL

Note 1: Pulse Width 50 µs, Duty Cycle 10%

Output Impedance 50 Ω, tr ≤ 5 ns, tf ≤ 10 ns

Note 2: CL includes probe and jig capacitance.

Precautions for Using

This IC does not integrate protection circuits such as overcurrent and overvoltage protectors.

Thus, if excess current or voltage is applied to the IC, the IC may be damaged. Please design the IC so that

excess current or voltage will not be applied to the IC.

Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to

short-circuit between outputs, air contamination fault, or fault by improper grounding.

4

2006-06-14

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