UPD70108C 查看數據表（PDF） - NEC => Renesas Technology
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UPD70108C Datasheet PDF : 12 Pages
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NEC Electronics Inc.
Roseville Manufacturing
Table 3. HTB Life Test Summary and Failure Rate Predictions (continued)
Process Type Process Period
µPD70335
(84-pin PLCC)
CMOS-5
Total
µPD78352
(64-pin LQFP)
CMOS-8
Total
Jan 94- Mar 99
(cumulative)
Apr 88– Mar 99
(cumulative)
Oct 94– Mar 99
(cumulative)
Oct 94– Mar 99
(cumulative)
Ambient
Temp.
(125°C)
Number
of
Devices
532
Accum,.
Device
Hours
532,000
(125°C) 3368
3,356,000
(125°C) 192
192,000
(125°C) 192
192,000
No. of
Failures
0
1
0
0
Accel.
Factor
(Note 1)
11.3
11.3
_
_
Equiv.
Device
Hours
6.01 x 106
3.79 x 107
_
_
Failure Rate, 55°C
and 60% Confidence
Level (Note 2)
0.0053%/1000H
= 53FIT
Note 3
Notes: 1. The acceleration factor was calculated using the Arrhenius mathematical model.
2. FIT was derived from HTB data for all available time periods.
3. Some of the above FIT rates were not calculated. Due to small sample sizes in these cases, the FIT rates would not be
meaningful. NEC expects a FIT rate of less than 100 for micro device types (target not to exceed 150).
7
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