ADT7411ARQZ10 查看數據表（PDF） - Analog Devices

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ADT7411ARQZ10

SPI®/I2C® Compatible, 10-Bit Digital Temperature Sensor and 8-Channel ADC

Analog Devices 

TERMINOLOGY

Relative Accuracy

Relative accuracy or integral nonlinearity (INL) is a measure of

the maximum deviation, in LSBs, from a straight line passing

through the endpoints of the ADC transfer function. A typical

INL versus code plot can be seen in Figure 10.

Total Unadjusted Error (TUE)

Total unadjusted error is a comprehensive specification that

includes the sum of the relative accuracy error, gain error, and

offset error under a specified set of conditions.

Offset Error

This is a measure of the offset error of the ADC. It can be

negative or positive. It is expressed in mV.

Gain Error

This is a measure of the span error of the ADC. It is the

deviation in slope of the actual ADC transfer characteristic

from the ideal expressed as a percentage of the full-scale range.

Offset Error Drift

This is a measure of the change in offset error with changes in

temperature. It is expressed in (ppm of full-scale range)/°C.

Gain Error Drift

This is a measure of the change in gain error with changes in

temperature. It is expressed in (ppm of full-scale range)/°C.

ADT7411

Long -term Temperature Drift

This is a measure of the change in temperature error with the

passage of time. It is expressed in degrees Celsius. The concept

of long-term stability has been used for many years to describe

by what amount an IC’s parameter would shift during its

lifetime. This is a concept that has been typically applied to both

voltage references and monolithic temperature sensors.

Unfortunately, integrated circuits cannot be evaluated at room

temperature (25°C) for 10 years or so to determine this shift. As

a result, manufacturers typically perform accelerated lifetime

testing of integrated circuits by operating ICs at elevated

temperatures (between 125°C and 150°C) over a shorter period

of time (typically, between 500 and 1,000 hours). As a result of

this operation, the lifetime of an integrated circuit is

significantly accelerated due to the increase in rates of reaction

within the semiconductor material.

DC Power Supply Rejection Ratio (PSRR)

The power supply rejection ratio (PSRR) is defined as the ratio

of the power in the ADC output at full-scale frequency f, to the

power of a 100 mV sine wave applied to the VDD supply of

frequency fs:

PSRR (dB) = 10 log (Pf Pfs)

Pf = power at frequency f in ADC output

Pfs = power at frequency fs coupled into the VDD supply

Round Robin

This term is used to describe the ADT7411 cycling through

the available measurement channels in sequence, taking a

measurement on each channel.

Rev. A | Page 9 of 36

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