IDT54FCT162244AT 查看數據表（PDF） - Integrated Device Technology
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IDT54FCT162244AT Datasheet PDF : 9 Pages
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IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
OUTPUT DRIVE CHARACTERISTICS FOR FCT16244T
Symbol
IO
Parameter
Output Drive Current
Test Conditions(1)
VCC = Max., VO = 2.5V(3)
Min. Typ.(2) Max. Unit
–50 — –180 mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –3mA
2.5 3.5 —
V
VIN = VIH or VIL
IOH = –12mA MIL.
2.4 3.5 —
V
IOH = –15mA COM'L.
IOH = –24mA MIL.
2.0 3.0 —
V
IOH = –32mA COM'L.(4)
VOL
Output LOW Voltage
VCC = Min.
IOL = 48mA MIL.
— 0.2 0.55 V
VIN = VIH or VIL
IOL = 64mA COM'L.
IOFF
Input/Output Power Off Leakage(5) VCC = 0V, VIN or VO ≤ 4.5V
—
—
±1
µA
OUTPUT DRIVE CHARACTERISTICS FOR FCT162244T
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Symbol
IODL
Parameter
Output LOW Current
Test Conditions(1)
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
Min. Typ.(2) Max. Unit
60 115 200 mA
IODH
Output HIGH Current
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
–60 –115 –200 mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –16mA MIL.
2.4 3.3 —
V
VIN = VIH or VIL
IOH = –24mA COM'L.
VOL
Output LOW Voltage
VCC = Min.
IOL = 16mA MIL.
— 0.3 0.55 V
VIN = VIH or VIL
IOL = 24mA COM'L.
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OUPUT DRIVE CHARACTERISTICS FOR FCT166244T
Symbol
IODL
IODH
Parameter
Output LOW Current
Output HIGH Current
Test Conditions(1)
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
Min. Typ.(2) Max. Unit
16 48 96 mA
–16 –48 –96 mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –6mA MIL.
2.4 3.3 —
V
VIN = VIH or VIL
IOH = –8mA COM'L.
VOL
Output LOW Voltage
VCC = Min.
IOL = 6mA MIL.
— 0.3 0.55 V
NOTES:
VIN = VIH or VIL
IOL = 8mA COM'L.
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1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ± 5µA at TA = –55°C.
5.2
5
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