HD74LV00AFPEL 查看數據表（PDF） - Renesas Electronics

零件编号

产品描述 (功能)

比赛名单

HD74LV00AFPEL

Quad. 2-input NAND Gates

Renesas Electronics 

HD74LV00A

Test Circuit

Measurement point

CL*

Note: CL includes the probe and fig capacitance.

• Waveform − 1

Input

tr

10%

90%

50% VCC

tPLH

tf

90%

50% VCC

10%

tPHL

In phase output

tPHL

50% VCC

50% VCC

tPLH

Out of phase output

50% VCC

50% VCC

VCC

0V

VOH

VOL

VOH

VOL

Notes: 1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns

2. The output are measured one at a time with one transition per measurement.

Rev.3.00, May 20, 2004, page 6 of 8

Share Link: