TB62706 查看數據表（PDF） - Toshiba

零件编号

产品描述 (功能)

比赛名单

TB62706

Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

TEST CIRCUIT

DC characteristic

AC characteristic

TB62706BN/BF

PRECAUTIONS for USING

Utmost care is necessary in the design of the output line, VCC (VDD) and GND line since IC may be destroyed

due to short−circuit between outputs, air contamination fault, or fault by improper grounding.

7

2006-06-14

Share Link: