CAT28C16AX20 查看數據表（PDF） - ON Semiconductor
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CAT28C16AX20 Datasheet PDF : 10 Pages
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CAT28C16A
Table 4. RELIABILITY CHARACTERISTICS (Note 4)
Symbol
Parameter
Min
Max
NEND (Note 5)
Endurance
100,000
TDR (Notes 5)
Data Retention
100
VZAP
ESD Susceptibility
2,000
ILTH (Note 6)
Latch−Up
100
4. This parameter is tested initially and after a design or process change that affects the parameter.
5. For the CAT28C16A−20, the minimum endurance is 10,000 cycles and the minimum data retention is 10 years.
6. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V.
Units
Cycles/Byte
Years
V
mA
Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.)
Limits
Symbol
Parameter
Test Conditions
Min
Typ
Max
ICC
VCC Current (Operating, TTL)
CE = OE = VIL,
35
f = 1/tRC min, All I/O’s Open
ICCC (Note 7)
VCC Current (Operating, CMOS) CE = OE = VILC,
25
f = 1/tRC min, All I/O’s Open
ISB
VCC Current (Standby, TTL)
CE = VIH, All I/O’s Open
1
ISBC (Note 8)
VCC Current (Standby, CMOS)
CE = VIHC, All I/O’s Open
100
ILI
Input Leakage Current
VIN = GND to VCC
−10
10
ILO
Output Leakage Current
VOUT = GND to VCC,
−10
10
CE = VIH
VIH (Note 8)
High Level Input Voltage
VIL (Note 7)
Low Level Input Voltage
VOH
High Level Output Voltage
VOL
Low Level Output Voltage
VWI
Write Inhibit Voltage
7. VILC = −0.3 V to +0.3 V
8. VIHC = VCC − 0.3 V to VCC + 0.3 V
IOH = −400 mA
IOL = 2.1 mA
2
−0.3
2.4
3.0
VCC + 0.3
0.8
0.4
Units
mA
mA
mA
mA
mA
mA
V
V
V
V
V
Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.)
28C16A−90
28C16A−12
Symbol
Parameter
Min
Max
Min
Max
tRC
tCE
tAA
tOE
tLZ (Note 9)
tOLZ (Note 9)
tHZ (Notes 9, 10)
tOHZ (Notes 9,
10)
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
CE Low to Active Output
OE Low to Active Output
CE High to High−Z Output
OE High to High−Z Output
90
120
90
120
90
120
50
60
0
0
0
0
50
50
50
50
28C16A−20
Min
Max
200
200
200
80
0
0
55
55
Units
ns
ns
ns
ns
ns
ns
ns
ns
tOH (Note 9)
Output Hold from Address Change
0
0
0
ns
9. This parameter is tested initially and after a design or process change that affects the parameter.
10. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.
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