HSP48410/883
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: VCC = 5.0V ±10%, TA = -55oC to 125oC (Note 1)
PARAMETER
SYMBOL
NOTES
GROUP A
SUBGROUPS
TEMP (oC)
-33 (33MHz)
MIN MAX
-25 (25.6MHz)
MIN MAX
UNITS
Clock Period
t CP
9, 10, 11
-55 ≤ TA ≤ 125
30
-
39
-
ns
Clock Low
t CH
9, 10, 11
-55 ≤ TA ≤ 125
12
-
15
-
ns
Clock High
t CL
9, 10, 11
-55 ≤ TA ≤ 125
12
-
15
-
ns
DIN Setup
t DS
9, 10, 11
-55 ≤ TA ≤ 125
15
-
16
-
ns
DIN 0-23 Hold
t DH
9, 10, 11
-55 ≤ TA ≤ 125
1
-
1
-
ns
Clock to DIO 0-23 Valid
t DO
9, 10, 11
-55 ≤ TA ≤ 125
-
19
-
24
ns
FC Pulse Width
t FL
9, 10, 11
-55 ≤ TA ≤ 125
35
-
35
-
ns
FCT 0-2 Setup to LD
t FS
9, 10, 11
-55 ≤ TA ≤ 125
12
-
15
-
ns
FCT 0-2 Hold from LD
t FH
9, 10, 11
-55 ≤ TA ≤ 125
1
-
1
-
ns
START Setup to CLK
t SS
9, 10, 11
-55 ≤ TA ≤ 125
15
-
16
-
ns
START Hold from CLK
t SH
9, 10, 11
-55 ≤ TA ≤ 125
0
-
0
-
ns
PIN 0-9 Setup Time
t PS
9, 10, 11
-55 ≤ TA ≤ 125
15
-
16
-
ns
PIN 0-9 Hold Time
t PH
9, 10, 11
-55 ≤ TA ≤ 125
1
-
1
-
ns
LD Pulse Width
t LL
9, 10, 11
-55 ≤ TA ≤ 125
12
-
15
-
ns
LD Setup to START
t LS
Note 7
9, 10, 11
-55 ≤ TA ≤ 125
tCP
tCP
-
ns
WR Low
tWL
9, 10, 11
-55 ≤ TA ≤ 125
15
-
20
-
ns
WR High
t WH
9, 10, 11
-55 ≤ TA ≤ 125
15
-
20
-
ns
Address Setup
t AS
9, 10, 11
-55 ≤ TA ≤ 125
16
-
20
-
ns
Address Hold
t AH
9, 10, 11
-55 ≤ TA ≤ 125
2
-
2
-
ns
DIO Setup to WR
t WS
9, 10, 11
-55 ≤ TA ≤ 125
16
-
20
-
ns
DIO Hold from WR
t WH
9, 10, 11
-55 ≤ TA ≤ 125
2
-
2
-
ns
RD Low
t RL
9, 10, 11
-55 ≤ TA ≤ 125
43
-
55
-
ns
RD High
t RH
9, 10, 11
-55 ≤ TA ≤ 125
17
-
20
-
ns
RD Low to DIO Valid
t RD
9, 10, 11
-55 ≤ TA ≤ 125
-
43
-
55
ns
Output Enable Time
t OE
Note 8
9, 10, 11
-55 ≤ TA ≤ 125
-
19
-
24
ns
Read/Write Cycle Time
t CY
9, 10, 11
-55 ≤ TA ≤ 125
65
-
80
-
ns
NOTES:
6. AC Testing is performed as follows: Input levels (CLK) 0.0V and 4.0V; input levels (all other inputs) 0V and 3.0V. Timing reference levels (CLK)
= 2.0V, (all others) = 1.5V. Output load circuit with CL= 40pF. Output transition measured at VOH ≥ 1.5V and VOL ≥ 1.5V.
7. There must be at least one rising edge of CLK between the rising edge of LD and the falling edge of START.
8. Transition is measured at ±200 mV from steady state voltage with loading as specified in test load circuit with CL= 40pF.
5