IRG4BC10KD 查看數據表（PDF） - International Rectifier

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IRG4BC10KD

INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE

International Rectifier 

IRG4BC10KD

Vg G ATE SIG NAL

DEVICE UNDER TEST

CUR REN T D .U .T.

VO LTAG E IN D.U.T.

CURRENT IN D1

t0

t1 t2

Figure 18e. Macro Waveforms for Figure 18a's Test Circuit

50V

6000µF

100V

L

1 0 0 0 V Vc*

D.U.T.

0 - 480V

RL=

480V

4 X IC @25°C

Figure 19. Clamped Inductive Load Test Circuit

Figure 20. Pulsed Collector Current

Test Circuit

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