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MC44608P40 查看數據表(PDF) - ON Semiconductor

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MC44608P40 Datasheet PDF : 15 Pages
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MC44608
ELECTRICAL CHARACTERISTICS (VCC = 12 V, for typical values TA = 25°C, for min/max values TA = 25°C to +85°C unless
otherwise noted) (Note 2)
Characteristic
DEMAGNETIZATION DETECTION section (note 3)
Demag Comparator Threshold (Vpin1 increasing)
Demag Comparator Hysteresis (Note 4)
Propagation Delay (Input to Output, Low to High)
Input Bias Current (Vdemag = 50 mV)
Negative Clamp Level (Idemag = 1.0 mA)
Positive Clamp Level @ Idemag = 125 mA
Positive Clamp Level @ Idemag = 25 mA
OVERTEMPERATURE section
Trip Level Over Temperature
Hysteresis
STANDBY MAXIMUM CURRENT REDUCTION section
Normal Mode Recovery Demag Pin Current Threshold
K FACTORS SECTION FOR PULSED MODE OPERATION
ICCS / Istup
MC44608P40
ICCS / Istup
MC44608P75
ICCL / Istup
(Vstup UVLO2) / (Vstup UVLO1)
(UVLO1 UVLO2) / (Vstup UVLO1)
ICS / Vcsth
Demag ratio Iovp / Idem NM
(V3 1.0 mA V3 0.5 mA) / (1.0 mA 0.5 mA)
Vcontrol Latchoff
SUPPLY SECTION
Minimum Startup Voltage
VCC Startup Voltage
Output Disabling VCC Voltage After Turn On
Hysteresis (Vstupth Vuvlo1)
VCC Undervoltage Lockout Voltage
Hysteresis (Vuvlo1 Vuvlo2)
Absolute Normal Condition VCC Start Current @ (Vi = 100 V) and
(VCC = 9.0 V)
Switching Phase Supply Current (no load)
MC44608P40
MC44608P75
Symbol
Vdmgth
Hdmg
tPHL(In/Out)
Idemlb
Vclnegdem
VclposdemH
VclposdemL
Thigh
Thyst
IdemNM
10 x K1
10 x K1
103 x K2
102 x Ksstup
102 x Ksl
106 x Ycstby
Dmgr
R3
V3
Vilow
Vstupth
Vuvlo1
Hstupuvlo1
Vuvlo2
Huvlo1uvlo2
(ICC)
ICCS
Min
30
0.6
0.9
2.05
1.4
20
2.4
2.8
46
1.8
90
175
3.0
12.5
9.5
6.2
7.0
2.0
2.4
Typ
50
30
300
0.7
2.3
1.7
160
30
25
2.9
3.3
52
2.2
120
198
4.7
1800
4.8
13.1
10
3.1
6.6
3.4
9.5
2.6
3.2
Max Unit
69
mV
mV
ns
mA
0.4
V
2.8
V
1.9
V
°C
°C
30
mA
3.8
4.2
63
2.6
150
225
5.5
W
V
50
V
13.8
V
10.5
V
V
7.0
V
V
12.8 mA
3.6
mA
4.0
Latched Off Phase Supply Current
ICClatch
0.3
0.5
0.68 mA
Hiccup Mode Duty Cycle (no load)
dHiccup
10
%
2. Adjust VCC above the startup threshold before setting to 12 V. Low duty cycle pulse techniques are used during test to maintain junction
temperature as close to ambient as possible.
3. This function can be inhibited by connecting pin 1 to GND.
4. Guaranteed by design (non tested).
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