74AHC373D,118 查看數據表（PDF） - NXP Semiconductors.
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74AHC373D,118 Datasheet PDF : 17 Pages
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NXP Semiconductors
74AHC373; 74AHCT373
Octal D-type transparant latch; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
RL = load resistance.
S1 = test selection switch.
Fig 11. Test circuitry for switching times
Table 9. Test data
Type
Input
74AHC373
74AHCT373
VI
VCC
3.0 V
tr, tf
≤ 3.0 ns
≤ 3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 kΩ
1 kΩ
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT373_3
Product data sheet
Rev. 03 — 20 May 2008
© NXP B.V. 2008. All rights reserved.
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