MC74F579 查看數據表（PDF） - Motorola => Freescale
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MC74F579 Datasheet PDF : 4 Pages
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MC74F579
FUNCTION TABLE
MR
SR CS PE
CEP
CET
U/D
OE
X
X
H
X
X
X
X
X
X
X
L
H
X
X
X
H
X
X
L
H
X
X
X
L
L
X
X
X
X
X
X
X
H
L
X
X
X
X
X
X
H
H
L
L
X
X
X
X
H
H
(not LL)
H
X
X
X
H
H
(not LL)
X
H
X
X
H
H
(not LL)
L
L
H
X
H
H
(not LL)
L
L
L
X
H = High voltage level
L = Low voltage level
X = Don’t care
↑ = Low-to-High clock transition
(not LL) = CS and PE should never both be low voltage at the same time
CP
Function
X I/O0 to I/O7 in Hi-Z (PE disabled)
X I/O0 to I/O7 in Hi-Z
X Flip-Flop outputs appear on I/O lines
X Asynchronous reset for all flip-flops
↑ Synchronous reset for all flip-flops
↑ Parallel load all flip-flops
↑ Hold
↑ Hold (TC held high)
↑ Count up
↑ Count down
DC CHARACTERISTICS OVER OPERATING TEMPERATURE RANGE (unless otherwise specified)
Symbol
Parameter
74F
Unit
Min
Typ (2)
Max
Test Conditions
(Note 1)
VOH
Output HIGH Voltage
2.5
TC
2.7
3.4
2.4
3.3
I/On
2.7
3.3
IOH = – 1.0 mA VCC = 4.5 V
V
VIL = MAX
VIH = MIN
VCC = 4.75 V
IOH = – 3.0 mA VCC = 4.5 V
V
VIL = MAX
VIH = MIN
VCC = 4.75 V
TC
VOL
Output LOW Voltage
I/On
0.35
0.5
IOL = 20 mA
VCC = 4.5 V
V
VIL = MAX
IOL = 24 mA
VIH = MIN
VIK
Input Clamp Diode Voltage
I/On
IIH
Input HIGH Current
others
I/On
others
–0.73
– 1.2
1.0
100
70
20
V
VCC = 4.5 V, IIN = – 18 mA
mA
µA
VCC = 5.5 V
VIN = 5.5 V
VIN = 7.0 V
µA
VCC = 5.5 V, VIN = 2.7 V
IIL
IOZH
IOZL
Input LOW Current
OFF-State Current
High-Level Voltage Applied
OFF-State Current
Low-Level Voltage Applied
Except
I/On
I/On
–0.6
70
–600
mA
VCC = 5.5 V, VIN = 0.5 V
µA
VCC = 5.5 V
VOUT = 2.7 V
VOUT = 0.5 V
IOS
Output Short Circuit Current (Note 3)
– 60
–80
–150
mA
VCC = MAX, VOUT = 0 V
ICCH
95
135
ICC
Total Supply Current (total)
ICCL
105
145
mA
VCC = MAX
ICCZ
105
150
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under guaranteed operating conditions for the applicable device type.
2. All typical values are at VCC = 5.0 V, TA = 25°C.
3. Not more than one output should be shorted at a time. For IOS testing, the use of high-speed test apparatus and/or sample-and-hold techniques are prefer-
able in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a HIGH output may raise the chip
temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be per-
formed last.
FAST AND LS TTL DATA
4-230
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