FST3126(2013) 查看數據表（PDF） - ON Semiconductor
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FST3126 Datasheet PDF : 7 Pages
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FST3126
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance (Note 1)
VI t GND
VO t GND
SOIC
TSSOP
*0.5 to )7.0
*0.5 to )7.0
*0.5 to )7.0
*50
*50
128
$100
$100
*65 to )150
260
)150
125
170
V
V
V
mA
mA
mA
mA
mA
_C
_C
_C
_C/W
MSL Moisture Sensitivity
Level 1
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Human Body Model (Note 2)
u4000
V
Machine Model (Note 3)
u300
Charged Device Model
u2000
ILatchup Latchup Performance
Above VCC and Below GND at 85_C (Note 4)
$500
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
VCC
Supply Voltage
Operating, Data Retention Only
4.0
5.5
VI
VO
TA
Dt/DV
Input Voltage
Output Voltage
Operating Free−Air Temperature
Input Transition Rise or Fall Rate
(Note 5)
0
(HIGH or LOW State)
0
−55
Switch Control Input
0
Switch I/O
0
5.5
5.5
+125
5
DC
5. Unused control inputs may not be left open. All control inputs must be tied to a high or low logic input voltage level.
Unit
V
V
V
_C
ns/V
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