HD74LV20AFPEL 查看數據表（PDF） - Renesas Electronics

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HD74LV20AFPEL

Dual 4-input Positive NAND Gates

Renesas Electronics 

HD74LV20A

Test Circuit

Measurement point

CL*

Note: CL includes the probe and jig capacitance.

• Waveform − 1

tr

tf

90%

90%

VCC

Input

50% VCC

50% VCC

10%

10%

0V

tPLH

tPHL

In phase output

tPHL

50% VCC

50% VCC

tPLH

VOH

VOL

Out of phase output

VOH

50% VCC

50% VCC

VOL

Notes:1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns

2. The output are measured one at a time with one transition per measurement.

Rev.3.00 May 31, 2004 page 6 of 8

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