MC74VHCT541A 查看數據表（PDF） - ON Semiconductor

零件编号

产品描述 (功能)

比赛名单

MC74VHCT541A

Octal Bus Buffer

ON Semiconductor 

MC74VHCT541A

ORDERING INFORMATION

Device

MC74VHCT541ADW

Package

SOIC−20WB

Shipping†

38 Units / Rail

MC74VHCT541ADWG

SOIC−20WB

(Pb−Free)

38 Units / Rail

MC74VHCT541ADWR2

SOIC−20WB

1000 / Tape & Reel

MC74VHCT541ADWRG

SOIC−20WB

(Pb−Free)

1000 / Tape & Reel

MC74VHCT541ADT

TSSOP−20*

75 Units / Rail

MC74VHCT541ADTG

TSSOP−20*

75 Units / Rail

MC74VHCT541ADTR2

TSSOP−20*

2500 / Tape & Reel

MC74VHCT541ADTRG

TSSOP−20*

2500 / Tape & Reel

MC74VHCT541AMEL

SOEIAJ−20

2000 / Tape & Reel

MC74VHCT541AMELG

SOEIAJ−20

(Pb−Free)

2000 / Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.

*This package is inherently Pb−Free.

A

tPLH

Y

1.5V

1.5V

3V

GND

tPHL

VOH

VOL

Figure 3. Switching Waveform

OE1 or OE2

Y

Y

1.5V

tPZL

tPLZ

1.5V

tPZH

tPHZ

1.5V

3V

GND

HIGH

IMPEDANCE

VOL +0.3V

VOH −0.3V

HIGH

IMPEDANCE

Figure 4. Switching Waveform

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

*Includes all probe and jig capacitance

Figure 5. Test Circuit

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kW

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 6. Test Circuit

http://onsemi.com

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