SPT7734SCT 查看數據表（PDF） - Cadeka Microcircuits LLC.

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SPT7734SCT

8-BIT, 40 MSPS,175 mW A/D CONVERTER

Cadeka Microcircuits LLC. 

ELECTRICAL SPECIFICATIONS

TA=TMAX to TMAX, AVDD=DVDD=+5.0 V, VIN=0 to 4 V, fS=40 MSPS, VRHS=4.0 V, VRLS=0.0 V, unless otherwise specified.

PARAMETERS

Dynamic Performance

Signal-to-Noise Ratio

(without Harmonics)

fIN=3.58 MHz

fIN=10.3 MHz

Harmonic Distortion

fIN=3.58 MHz

fIN=10.3 MHz

Signal-to-Noise and Distortion

(SINAD)

fIN=3.58 MHz

fIN=10.3 MHz

Spurious Free Dynamic Range

Differential Phase

Differential Gain

Intermodulation Distortion

Inputs

Logic 1 Voltage

Logic 0 Voltage

Maximum Input Current Low

Maximum Input Current High

Input Capacitance

Digital Outputs

Logic 1 Voltage

Logic 0 Voltage

tRISE

tFALL

Output Enable to Data Output Delay

Power Supply Requirements

Voltages OVDD

DVDD

AVDD

Currents AIDD

DIDD

Power Dissipation

TEST

CONDITIONS

9 Distortion bins from

1024 pt FFT

fIN=1.0 MHz

IOH = 0.5 mA

IOL = 1.6 mA

15 pF load

15 pF load

20 pF load, TA = +25 °C

50 pF load over temp.

TEST

LEVEL

VI

VI

VI

VI

VI

VI

V

V

V

VI

VI

VI

VI

V

VI

VI

V

V

V

V

IV

IV

IV

VI

VI

VI

MIN

46

45

53

53

46

45

2.0

-10

-10

3.5

3.0

4.75

4.75

SPT7734

TYP

49

48

57

56

49

48

63

±0.3

±0.3

TBD

+5

10

10

10

22

5.0

5.0

17

18

175

MAX UNITS

dB

dB

dB

dB

dB

dB

dB

Degree

%

dB

V

0.8 V

+10 µA

+10 µA

pF

V

0.4 V

ns

ns

ns

ns

5.0 V

5.25 V

5.25 V

22 mA

23 mA

225 mW

TEST LEVEL CODES

TEST LEVEL

All electrical characteristics are subject to the

I

following conditions:

II

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

III

cates the specific device testing actually per-

IV

formed during production and Quality Assur-

ance inspection. Any blank section in the data

V

column indicates that the specification is not

tested at the specified condition.

VI

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA=25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = 25 °C. Parameter is

guaranteed over specified temperature range.

SPT7734

3

1/27/98

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