AS6C3216A-55TIN 查看數據表（PDF） - Alliance Semiconductor
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AS6C3216A-55TIN Datasheet PDF : 12 Pages
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AS6C3216A-55TIN
DC ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL
TEST CONDITION
MIN. TYP. *4 MAX. UNIT
Supply Voltage
Input High Voltage
Input Low Voltage
Input Leakage Current
VCC
VIH*1
VIL*2
ILI
VCC ≧VIN ≧VSS
2.7
2.2
- 0.2
-1
3.0 3.6
V
- VCC+0.3 V
-
0.6
V
-
1
µA
Output Leakage
Current
ILO
VCC ≧VOUT ≧VSS
Output Disabled
-1
-
1
µA
Output High Voltage
VOH IOH = -1mA
2.2 2.7
-
V
Output Low Voltage
VOL IOL = 2mA
-
-
0.4
V
Average Operating
Power supply Current
Cycle time = Min.
ICC
CE# ≦ 0.2V and CE2 ≧ VCC-0.2V
II/O = 0mA
Other pins at 0.2V or VCC-0.2V
Cycle time = 1µs
-
12
20
mA
ICC1
CE# ≦ 0.2V and CE2 ≧ VCC-0.2V
II/O = 0mA
-
3
5
mA
Other pins at 0.2V or VCC-0.2V
Standby Power
Supply Current
CE# ≧VCC-0.2V
ISB1
or CE2≦0.2V
Other pins at 0.2V
or VCC-0.2V
-
8
18
µA *5
-
-
50
µA *6
Notes:
1. VIH(max) = VCC + 2.0V for pulse width less than 6ns.
2. VIL(min) = VSS - 2.0V for pulse width less than 6ns.
3. Over/Undershoot specifications are characterized on engineering evaluation stage, not for mass production test.
4. Typical values, measured at VCC = VCC(TYP.) and TA = 25℃, are included for reference only and are not guaranteed or tested.
5. This parameter is measured at VCC=3.0V.
6. This parameter is measured at TA = 70℃
CAPACITANCE (TA = 25℃, f = 1.0MHz)
PARAMETER
SYMBOL
MIN.
Input Capacitance
CIN
-
Input/Output Capacitance
CI/O
-
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
MAX
8
8
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
0.2V to VCC - 0.2V
3ns
1.5V
CL = 30pF + 1TTL, IOH/IOL = -1mA/2mA
UNIT
pF
pF
Confidential
- 5 of 12 -
Rev.1.0. Mar. 2017
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