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SPMWHT223MD5WAW0S0 查看數據表(PDF) - Samsung

零件编号
产品描述 (功能)
比赛名单
SPMWHT223MD5WAW0S0
Samsung
Samsung Samsung
SPMWHT223MD5WAW0S0 Datasheet PDF : 49 Pages
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6. Reliability Test Items & Conditions
1) Test Items and Results
Test Item
MSL Test
Room Temperature
Life Test
High Temperature
Life Test
High Temperature
Humidity Life Test
Low Temperature
Life Test
Powered Temperature
Cycle Test
Thermal Shock
High Temperature
Storage
Low Temperature
Storage
ESD(HBM)
ESD(MM)
Test Conditions
Test
Hours/Cycles
125, 24hrs 60, 60%RH, 120hrs Peak
260±5, 220over time 60sec, 3 cycles
1 cycle
25±3, DC 150mA
1,000 hrs
85±3, DC 150mA
1,000 hrs
85±3, 85%±2%RH, DC 150mA
1,000 hrs
-40±3, DC 150mA
-45/20min 85/20min, Sweep 100min
cycle on/off: each 5min, DC 150mA
-45/15min 125/15min,
Hot plate 180
Ta=120±3
1,000 hrs
100 cycles
500 cycles
1,000 hrs
Ta=-40±3
R1 : 10MΩ,
R2 : 1.5KΩ,
C : 100pF,
V = ±5kV
R1 : 10MΩ,
R2 : 0,
C : 200pF,
V = ±0.5kV
1,000 hrs
5 times
5 times
Sample
No
11
22
22
22
22
22
100
11
11
5
5
Vibration Test
20~2000~20 Hz 200 m/s2, Sweep 4 min
X, Y, Z 3 direction, each 1 cycle
4 cycles
11
Mechanical Shock Test
1500G, 0.5ms,
3 shocks each X-Y-Z axis
5 cycles
11
2) Criteria for Judging the Damage
Item
Forward Voltage
Luminous Flux
Symbol
VF
Φv
Test Condition
IF = 65
IF = 65
Limit
Min
Max
Init. Value*0.9
Init. Value*1.1
Init. Value*0.7
Init. Value*1.1
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