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NLV37WZ16USG(2014) 查看數據表(PDF) - ON Semiconductor

零件编号
产品描述 (功能)
比赛名单
NLV37WZ16USG
(Rev.:2014)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
NLV37WZ16USG Datasheet PDF : 5 Pages
1 2 3 4 5
NL37WZ16
MAXIMUM RATINGS
Symbol
Parameter
Value
Units
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Output in Z or LOW State (Note 1)
DC Input Diode Current
VI < GND
DC Output Diode Current
VO < GND
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature under Bias
Thermal Resistance (Note 2)
Power Dissipation in Still Air at 85_C
Moisture Sensitivity
−0.5 to +7.0
−0.5 VI +7.0
−0.5 VO +7.0
−50
−50
±50
±100
±100
−65 to +150
260
+150
333
200
Level 1
V
V
V
mA
mA
mA
mA
mA
_C
_C
_C
_C/W
mW
FR
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
V
> 2000
> 200
N/A
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Units
VCC Supply Voltage
Operating
Data Retention Only
V
1.65
5.5
1.5
5.5
VI
Input Voltage (Note 6)
0
5.5
V
VO
Output Voltage (HIGH or LOW State)
0
5.5
V
TA
Operating Free−Air Temperature
−40
+85
_C
Dt/DV
Input Transition Rise or Fall Rate
VCC = 2.5 V ±0.2 V
VCC = 3.0 V ±0.3 V
VCC = 5.0 V ±0.5 V
ns/V
0
20
0
10
0
5
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
6. Unused inputs may not be left open. All inputs must be tied to a high−logic voltage level or a low−logic input voltage level.
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