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MMA7660FCR1(2009) 查看數據表(PDF) - Freescale Semiconductor

零件编号
产品描述 (功能)
比赛名单
MMA7660FCR1
(Rev.:2009)
Freescale
Freescale Semiconductor Freescale
MMA7660FCR1 Datasheet PDF : 34 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Table 4. Operating Characteristics
Unless otherwise noted: -40°C < TA < 85°C, 2.4 V < AVDD < 3.6 V, 1.71 V < DVDD < 3.6 V, Acceleration = 0g
Typical values are at AVDD = 2.8 V, DVDD = 2.8 V, TA = +25°C
Characteristics
Symbol
Min
Typ
Max
Analog Supply Voltage
Standby/Operation Mode
Enable Bus Modeon Mode
Digital I/O Pins Supply Voltage
AVDD
2.4
2.8
3.6
AVDD
0
Standby/Operation Mode
Enable Bus Modeon Mode
Supply Current Drain
DVDD_IO
1.71
2.8
DVDD_IO
1.71
1.8
AVDD
3.6
Off Mode
Power Down Mode
Standby Mode(1)
Active Mode, ODR = 1
Active Mode, ODR = 2
Active Mode, ODR = 4
Active Mode, ODR = 8
Active Mode, ODR = 16
Active Mode, ODR = 32
Active Mode, ODR = 64
Active Mode(1), ODR = 120
Acceleration Range
IDD
0.4
IDD
2
IDD
0
2
10
IDD
47
IDD
49
IDD
54
IDD
66
IDD
89
IDD
133
IDD
221
IDD
294
±1.5
Operating Temperature Range
0g Output Signal (TA = 25°C, AVDD = 2.8 V)
0g Offset ±1.5g range(1)
0g Offset Temperature Variation
X
TA
-40
25
85
VOFF
-3
0
3
-1.3
Y
+1.5
Z
-1.0
Sensitivity(1) (TA = 25°C, AVDD = 2.8 V)
±1.5g range 6-bit
21.33
Acceleration Sensitivity at TAMB
Acceleration Sensitivity Temperature Variation
19.62
21.33
±0.01
23.04
Input High Voltage
Input Low Voltage
Output Low Voltage (IOL = 6 mA + SDA, INT)
Input Leakage Current
Internal Clock Frequency(1) (TA = 25°C, AVDD = 2.8 V)
I2C Interface Speed
VIH
VIL
VOL
IIH, IIL
tCLK
0.7 x DVDD
135
0.025
150
0.35 x DVDD
0.5
165
400
Control Timing
Turn on time from AVDD = 0 V to AVDD = 2.5 V(2)
1.3
Turn off time from Active to Standby Mode
1
Turn on time Standby to Active Mode
12 ms + 1/ODR
Timing Clock Source Accuracy (TA = 25°C, DVDD = 1.8 V)
-10
10
Timing Clock Source Temperature Variation
-15
15
Cross Axis Sensitivity(3)
±1
Noise(4)
±1
Unit
V
V
V
V
µA
µA
µA
µA
µA
µA
µA
µA
µA
µA
µA
g
°C
counts
mg/°C
mg/°C
mg/°C
count/g
count/g
%/°C
V
µA
kHz
kHz
ms
ms
ms
%
%
%
count
Notes
1. These parameters are tested in production at final test.
2. Assuming VDD power on slope is < 1 ms.
3. A measure of the devices ability to reject an acceleration applied 90° from the true axis of sensitivity.
4. Noise is defined as quantiles given to a sample size. These are the occurrences of noise: 94% = ±1 count, 5% = ±2 counts, and 1% = ±3
counts.
Sensors
Freescale Semiconductor
MMA7660FC
8

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