TPP25011(1998) 查看數據表（PDF） - STMicroelectronics

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TPP25011
(Rev.:1998)

OVERVOLTAGE and OVERCURRENT PROTECTION for TELECOM LINE

STMicroelectronics 

TPP25011

REFERENCE TEST CIRCUIT 1 :

Auto

Transformer

220V/2A

tp = 20ms

R1

static

140

relay.

R2

240

Vout

K

IBO

measure

D.U.T

V BO

measure

Transformer

22 0V/ 800 V

5A

TEST PROCEDURE :

Pulse Test duration (tp = 20ms):

- For Bidirectional devices = Switch K is closed

- For Unidirectional devices = Switch K is open.

VOUT Selection

- Device with VBO < 200 Volt

- VOUT = 250 VRMS, R1 = 140 Ω.

- Device with VBO ≥ 200 Volt

- VOUT = 480 VRMS, R2 = 240 Ω.

FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT 2 = GO - NOGO TEST

R

VBAT = - 48 V

D.U.T.

- VP

Surge generator

This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional

test circuit.

TEST PROCEDURE :

1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.

2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.

3) The D.U.T will come back off-state within 50 ms max.

4/7

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