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BUJ303A(2011) 查看數據表(PDF) - NXP Semiconductors.

零件编号
产品描述 (功能)
比赛名单
BUJ303A
(Rev.:2011)
NXP
NXP Semiconductors. NXP
BUJ303A Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
NXP Semiconductors
VCC
LC
VCL(CE)
probe point
IBon
LB
VBB
DUT
001aab999
12
IC
(A)
8
4
BUJ303A
NPN power transistor
003aag028
0
0
400
800
1200
VCEclamp (V)
Fig 1. Test circuit for reverse bias safe operating area Fig 2. Reverse bias safe operating area
120
Pder
(%)
80
001aab993
40
0
0
40
80
120
160
Tmb (°C)
Fig 3. Normalized total power dissipation as a function of mounting base temperature
BUJ303A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 05 — 3 May 2011
© NXP B.V. 2011. All rights reserved.
3 of 14

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