HD74HC30 查看數據表（PDF） - Renesas Electronics

零件编号

产品描述 (功能)

比赛名单

HD74HC30

8-input NAND Gates

Renesas Electronics 

HD74HC30

Test Circuit

Measurement point

CL*

Note: CL includes the probe and fig capacitance.

Waveforms

• Waveform − 1

tr

tf

90%

90%

VCC

Input

50%

50%

10%

10%

0V

tPHL

tPLH

Output

50%

VOH

50%

VOL

tTHL

tTLH

Notes: 1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, tr ≤ 6 ns, tf ≤ 6 ns

2. The output are measured one at a time with one transition per measurement.

Rev.2.00, Oct 06, 2005 page 4 of 6

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