HX6408VRN 查看數據表（PDF） - Honeywell International

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HX6408VRN

512k x 8 STATIC RAM

Honeywell International 

HX6408

Advanced Information

DATA RETENTION CHARACTERISTICS

Symbol Parameter

VDR

Data Retention Voltage

Typical

(1)

Worst Case (2)

Min Max

2.0

IDR

Data Retention Current

3

(1) Typical operating conditions: TA=25°C, pre-radiation.

(2) Worst case operating conditions: TA=-55°C to +125°C, post dose at 25°C

Units Test Conditions

V NCS=VDR

VI=VDR or VSS

mA NCS=VDD=VDR

VI=VRD or VSS

TESTER EQUIVALENT LOAD CIRCUIT

DUT

Output

1.9V

V1

249

V2

CL < 50 pf *

* CL = 5pf for TWQZ, TSHQZ, TPLQZ, and TGHQZ

Valid High

Output

Valid Low

Output

Tester AC Timing Characteristics

Input Levels *

VDD

VSS

* Input rise and fall times <5 ns.

Output Sense

Levels

VDD/2

High Z = VDD/2

VDD – 0.4V

0.4V

High Z

(VDD/2) + 0.2V

High Z

(VDD/2) - 0.2V

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